We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40Ca with T1/22v2K>9.9×1021 y and T1/20v2EC>1.4×1022 y and for 180W with T1/22v2K>3.1×1019 y and T1/20v2EC>9.4×1018 y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ∼1.4-30.
@article{arxiv.1604.08493,
title = {New Limits on Double Electron Capture of $^{40}$Ca and $^{180}$W},
author = {G. Angloher and M. Bauer and P. Bauer and I. Bavykina and A. Bento and C. Bucci and L. Canonica and C. Ciemniak and X. Defay and G. Deuter and A. Erb and F. v. Feilitzsch and N. Ferreiro Iachellini and P. Gorla and A. Gütlein and D. Hauff and P. Huff and C. Isaila and J. Jochum and M. Kiefer and M. Kimmerle and H. Kluck and H. Kraus and J. -C. Lanfranchi and J. Loebell and A Münster and C. Pagliarone and F. Petricca and S. Pfister and W. Potzel and F. Pröbst and F. Reindl and S. Roth and K. Rottler and C. Sailer and K. Schäffner and J. Schieck and J. Schmaler and S. Scholl and S. Schönert and W. Seidel and M. v. Sivers and L. Stodolsky and C. Strandhagen and R. Strauss and A. Tanzke and V. Tretyak and H. H. Trinh Thi and C. Türkoğlu and M. Uffinger and A. Ulrich and I. Usherov and S. Wawoczny and M. Willers and M. Wüstrich and A. Zöller},
journal= {arXiv preprint arXiv:1604.08493},
year = {2016}
}