Neutron study of in-plane skyrmions in MnSi thin films

S. A. Meynell; M. N. Wilson; K. L. Krycka; B. J. Kirby; H. Fritzsche; T. L. Monchesky

doi:10.1103/PhysRevB.96.054402

Neutron study of in-plane skyrmions in MnSi thin films

Mesoscale and Nanoscale Physics 2017-08-09 v1 Other Condensed Matter

Authors: S. A. Meynell , M. N. Wilson , K. L. Krycka , B. J. Kirby , H. Fritzsche , T. L. Monchesky

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Abstract

The magnetic structure of the in-plane skyrmions in epitaxial MnSi/Si(111) thin films is probed in three dimensions by the combination of polarized neutron reflectometry (PNR) and small angle neutron scattering (SANS). We demonstrate that skyrmions exist in a region of the phase diagram above at temperature of 10 K. PNR shows the skyrmions are confined to the middle of the film due to the potential well formed by the surface twists. However, SANS shows that there is considerable disorder within the plane indicating that the magnetic structure is a 2D skyrmion glass.

Keywords

skyrmions MnSi thin films polarized neutron reflectometry small angle neutron scattering magnetic structure skyrmion glass

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@article{arxiv.1706.01910,
  title  = {Neutron study of in-plane skyrmions in MnSi thin films},
  author = {S. A. Meynell and M. N. Wilson and K. L. Krycka and B. J. Kirby and H. Fritzsche and T. L. Monchesky},
  journal= {arXiv preprint arXiv:1706.01910},
  year   = {2017}
}

Neutron study of in-plane skyrmions in MnSi thin films

Abstract

Keywords

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