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Natural layered phlogopite dielectric for ultrathin two-dimensional optoelectronics

Materials Science 2025-05-15 v1 Applied Physics

Abstract

The integration of high-dielectric-constant (high-κ\kappa) materials with two-dimensional (2D) semiconductors is promising to overcome performance limitations and reach their full theoretical potential. Here we show that naturally occurring phlogopite mica, exfoliated into ultrathin flakes, can serve as a robust high-κ\kappa dielectric layer for transition metal dichalcogenide-based 2D electronics and optoelectronics. Phlogopite's wide bandgap (~4.8 eV), high dielectric constant (~11), and large breakdown field (10 MVcm1^{-1}) enable transistors with subthreshold swings down to 100 mVdec1^{-1}, minimal hysteresis (30-60 mV) and interface trap densities comparable to state-of-the-art oxide dielectrics. Moreover, phototransistors built upon monolayer molybdenum disulfide (MoS2_2) and phlogopite exhibit responsivities up to 3.3x104^{4} AW1^{-1} and detectivities near 1010^{10} Jones, surpassing devices based on conventional gate insulators. We further demonstrate the versatility of this natural dielectric by integrating phlogopite/MoS2_2 heterostructures into NMOS inverters, showcasing robust voltage gains and low-voltage operation. Our findings establish phlogopite as a promising, earth-abundant dielectric for next-generation 2D transistor technologies and high-performance photodetection.

Keywords

Cite

@article{arxiv.2505.09461,
  title  = {Natural layered phlogopite dielectric for ultrathin two-dimensional optoelectronics},
  author = {Thomas Pucher and Julia Hernandez-Ruiz and Guillermo Tajuelo-Castilla and José Ángel Martín-Gago and Carmen Munuera and Andres Castellanos-Gomez},
  journal= {arXiv preprint arXiv:2505.09461},
  year   = {2025}
}