Nanometer-resolution 3D Tomographic and Vectorial Near-field Imaging in Dielectric Optical Resonators
Abstract
All-dielectric optical nano-resonators, exhibiting exotic near-field distributions upon excitations, have emerged as low-loss, versatile and highly adaptable components in nanophotonic structures for manipulating electromagnetic waves and enhancing light-matter interactions. However, achieving experimental full three-dimensional characterization of near-fields within dielectric nano-resonators poses significant challenges. Here, we develop a novel technique using high-order sideband generation to image near-field wave patterns inside dielectric optical nano-resonators. By exploiting the phase-sensitivity of various harmonic orders that enables the detection of near-field distributions at distinct depths, we achieve three-dimensional tomographic and near-field imaging with nanometer resolution inside a micrometer-thick silicon anapole resonator. Furthermore, our method offers high-contrast polarization sensitivity and phase-resolving capability, providing comprehensive vectorial near-field information. Our approach can potentially be applied to diverse dielectric metamaterials, and becomes a valuable tool for comprehensive characterization of near-field wave phenomena within dielectric materials.
Keywords
Cite
@article{arxiv.2406.13171,
title = {Nanometer-resolution 3D Tomographic and Vectorial Near-field Imaging in Dielectric Optical Resonators},
author = {Bingbing Zhu and Qingnan Cai and Yaxin Liu and Sheng Zhang and Weifeng Liu and Qiong He and Lei Zhou and Zhensheng Tao},
journal= {arXiv preprint arXiv:2406.13171},
year = {2025}
}