Multiple ionization of neon by soft X-rays at ultrahigh intensity
Atomic Physics
2015-06-12 v1
Abstract
At the free-electron laser FLASH, multiple ionization of neon atoms was quantitatively investigated at 93.0 eV and 90.5 eV photon energy. For ion charge states up to 6+, we compare the respective absolute photoionization yields with results from a minimal model and an elaborate description. Both approaches are based on rate equations and take into acccout a Gaussian spatial intensity distribution of the laser beam. From the comparison we conclude, that photoionization up to a charge of 5+ can be described by the minimal model. For higher charges, the experimental ionization yields systematically exceed the elaborate rate based prediction.
Keywords
Cite
@article{arxiv.1302.0021,
title = {Multiple ionization of neon by soft X-rays at ultrahigh intensity},
author = {R Guichard and M Richter and J-M Rost and U Saalmann and A A Sorokin and K Tiedtke},
journal= {arXiv preprint arXiv:1302.0021},
year = {2015}
}
Comments
10 pages, 3 figures