Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach
Mesoscale and Nanoscale Physics
2015-04-20 v1 Accelerator Physics
Space Physics
Abstract
We found that the energy deposition fluctuations in the sensitive volumes may cause multiplicity scatters in the multiple cell upsets in the nanoscale (with feature sizes less than 100 nm) memories.
Cite
@article{arxiv.1504.04519,
title = {Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach},
author = {G. I. Zebrev and K. S. Zemtsov and R. G. Useinov and M. S. Gorbunov and V. V. Emeliyanov and A. I. Ozerov},
journal= {arXiv preprint arXiv:1504.04519},
year = {2015}
}
Comments
Conference abstract submission