English

Multi-state Swap Test Algorithm

Quantum Physics 2022-05-17 v1

Abstract

Estimating the overlap between two states is an important task with several applications in quantum information. However, the typical swap test circuit can only measure a sole pair of quantum states at a time. In this study we designed a recursive quantum circuit to measure overlaps of multiple quantum states ϕ1...ϕn|\phi_1...\phi_n\rangle concurrently with O(nlogn)O(n\log n) controlled-swap (CSWAP) gates and O(logn)O(\log n) ancillary qubits. This circuit enables us to get all pairwise overlaps among input quantum states ϕiϕj2|\langle\phi_i|\phi_j\rangle|^2. Compared with existing schemes for measuring the overlap of multiple quantum states, our scheme provides higher precision and less consumption of ancillary qubits. In addition, we performed simulation experiments on IBM quantum cloud platform to verify the superiority of the scheme.

Keywords

Cite

@article{arxiv.2205.07171,
  title  = {Multi-state Swap Test Algorithm},
  author = {Wen Liu and Han-Wen Yin and Zhi-Rao Wang and Wen-Qin Fan},
  journal= {arXiv preprint arXiv:2205.07171},
  year   = {2022}
}
R2 v1 2026-06-24T11:17:33.591Z