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More Data Can Hurt for Linear Regression: Sample-wise Double Descent

Machine Learning 2019-12-17 v1 Machine Learning Neural and Evolutionary Computing Statistics Theory Statistics Theory

Abstract

In this expository note we describe a surprising phenomenon in overparameterized linear regression, where the dimension exceeds the number of samples: there is a regime where the test risk of the estimator found by gradient descent increases with additional samples. In other words, more data actually hurts the estimator. This behavior is implicit in a recent line of theoretical works analyzing "double-descent" phenomenon in linear models. In this note, we isolate and understand this behavior in an extremely simple setting: linear regression with isotropic Gaussian covariates. In particular, this occurs due to an unconventional type of bias-variance tradeoff in the overparameterized regime: the bias decreases with more samples, but variance increases.

Keywords

Cite

@article{arxiv.1912.07242,
  title  = {More Data Can Hurt for Linear Regression: Sample-wise Double Descent},
  author = {Preetum Nakkiran},
  journal= {arXiv preprint arXiv:1912.07242},
  year   = {2019}
}
R2 v1 2026-06-23T12:46:47.553Z