Thickness dependence and strain effects in films of La1−xAxMnO3 perovskites are analyzed in the colossal magnetoresistance regime. The calculations are based on a generalization of a variational approach previously proposed for the study of manganite bulk. It is found that a reduction in the thickness of the film causes a decrease of critical temperature and magnetization, and an increase of resistivity at low temperatures. The strain is introduced through the modifications of in-plane and out-of-plane electron hopping amplitudes due to substrate-induced distortions of the film unit cell. The strain effects on the transition temperature and transport properties are in good agreement with experimental data only if the dependence of the hopping matrix elements on the Mn−O−Mn bond angle is properly taken into account. Finally variations of the electron-phonon coupling linked to the presence of strain turn out important in influencing the balance of coexisting phases in the film
@article{arxiv.cond-mat/0310758,
title = {Modelling of strain effects in manganite films},
author = {C. A. Perroni and V. Cataudella and G. De Filippis and G. Iadonisi and V. Marigliano and F. Ventriglia},
journal= {arXiv preprint arXiv:cond-mat/0310758},
year = {2009}
}