We show that a microscopic definition of crystal defect, based on the effective mean single-particle potential energy, makes it possible to detect and visualize various types of local and extended crystal defects and develop an effective algorithm for tracking their time evolution.
Cite
@article{arxiv.cond-mat/0212318,
title = {Microscopic Method for Dislocation Tracking},
author = {M. Patriarca and M. Robles and K. Kaski},
journal= {arXiv preprint arXiv:cond-mat/0212318},
year = {2007}
}