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Metrological Detection of Multipartite Entanglement from Young Diagrams

Quantum Physics 2021-02-26 v2

Abstract

We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson's rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and kk-separability are contained in this approach as the diagram's width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.

Keywords

Cite

@article{arxiv.2012.03862,
  title  = {Metrological Detection of Multipartite Entanglement from Young Diagrams},
  author = {Zhihong Ren and Weidong Li and Augusto Smerzi and Manuel Gessner},
  journal= {arXiv preprint arXiv:2012.03862},
  year   = {2021}
}

Comments

6 + 7 pages, 5 + 8 figures