Metasurface-based Mueller Matrix Microscope
Abstract
In conventional optical microscopes, image contrast of objects mainly results from the differences in light intensity and/or color. Muller matrix optical microscopes (MMMs), on the other hand, can provide significantly enhanced image contrast and rich information about objects by analyzing their interactions with polarized light. However, state-of-art MMMs are fundamentally limited by bulky and slow polarization state generators and analyzers. Here, we demonstrated the feasibility of applying metasurfaces to enable a fast and compact MMM, i.e., Meta-MMM. We developed a dual-color MMM, in both reflection and transmission modes, based on a chip-integrated high-speed (>20fps) metasurface polarization state analyzer (Meta-PSA) and realized high measurement accuracy for Muller matrix (MM) imaging. We then applied our Meta-MMM to nanostructure characterization, surface morphology analysis and discovered birefringent structures in honeybee wings. Our meta-MMMs hold the promise to revolutionize various applications from biological imaging, medical diagnosis, material characterization to industry inspection and space exploration.
Cite
@article{arxiv.2310.20131,
title = {Metasurface-based Mueller Matrix Microscope},
author = {Jiawei Zuo and Ashutosh Bangalore Aravinda Babu and Mo Tian and Jing Bai and Shinhyuk Choi and Hossain Mansur Resalat Faruque and Sarah Holloway and Michael N. Kozicki and Chao Wang and Yu Yao},
journal= {arXiv preprint arXiv:2310.20131},
year = {2023}
}