English

Measurements of Luminescence from Cleaved Silicon

Materials Science 2007-08-15 v1

Abstract

This paper outlines the results from experiments performed to gain further information about the structure and properties of cleaved silicon surfaces, using vacuum cleavage luminescence detection methods. The experiments involved detecting the luminescence produced by cleaving thin silicon plates within a high vacuum, by a process of converting the luminescence to an amplified electrical signal.

Keywords

Cite

@article{arxiv.0708.1847,
  title  = {Measurements of Luminescence from Cleaved Silicon},
  author = {Dongguang Li},
  journal= {arXiv preprint arXiv:0708.1847},
  year   = {2007}
}

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