Measurement of atomic diffraction phases induced by material gratings
Atomic Physics
2009-11-11 v1
Abstract
Atom-surface interactions can significantly modify the intensity and phase of atom de Broglie waves diffracted by a silicon nitride grating. This affects the operation of a material grating as a coherent beam splitter. The phase shift induced by diffraction is measured by comparing the relative phases of serveral interfering paths in a Mach-Zehnder Na atom interferometer formed by three material gratings. The values of the diffraction phases are consistent with a simple model which includes a van der Waals atom-surface interaction between the Na atoms and the silicon nitride grating bars.
Cite
@article{arxiv.physics/0508196,
title = {Measurement of atomic diffraction phases induced by material gratings},
author = {John D. Perreault and Alexander D. Cronin},
journal= {arXiv preprint arXiv:physics/0508196},
year = {2009}
}
Comments
4 pages, 5 figures, submitted to PRL