Measurement-Based Entanglement of Semiconductor Spin Qubits
Quantum Physics
2024-07-17 v1 Mesoscale and Nanoscale Physics
Abstract
Measurement-based entanglement is a method for entangling quantum systems through the state projection that accompanies a parity measurement. We derive a stochastic master equation describing measurement-based entanglement of a pair of silicon double-dot flopping-mode spin qubits, develop numerical simulations to model this process, and explore what modifications could enable an experimental implementation of such a protocol. With device parameters corresponding to current qubit and cavity designs, we predict an entanglement fidelity 61%. By increasing the cavity outcoupling rate by a factor of ten, we are able to obtain a simulated 81% while maintaining a yield of 33%.
Keywords
Cite
@article{arxiv.2312.15493,
title = {Measurement-Based Entanglement of Semiconductor Spin Qubits},
author = {Remy L. Delva and Jonas Mielke and Guido Burkard and Jason R. Petta},
journal= {arXiv preprint arXiv:2312.15493},
year = {2024}
}