A circuit-simulation-based method is used to determine the thermally-induced bit error rate of superconducting logic circuits. Simulations are used to evaluate the multidimensional Gaussian integral across noise current sources attached to the active devices. The method is data-assisted and has predictive power. Measurement determines the value of a single parameter, effective noise bandwidth, for each error mechanism. The errors in the distributed networks of comparator-free RQL logic nucleate across multiple Josephson junctions, so the effective critical current is about three times that of the individual devices. The effective noise bandwidth is only 6-23% of the junction plasma frequency at a modest clock rate of 3.4GHz, which is 1% of the plasma frequency. This analysis shows the ways measured bit error rate comes out so much lower than simplistic estimates based on isolated devices.
@article{arxiv.2104.07092,
title = {Measurement and Data-Assisted Simulation of Bit Error Rate in RQL Circuits},
author = {Quentin Herr and Alex Braun and Andrew Brownfield and Ed Rudman and Dan Dosch and Trent Josephsen and Anna Herr},
journal= {arXiv preprint arXiv:2104.07092},
year = {2023}
}