English

LookSharp: Attention Entropy Minimization for Test-Time Adaptation

Computer Vision and Pattern Recognition 2026-02-10 v3

Abstract

Test-time adaptation (TTA) updates models during inference to reduce error on distribution shifts. While entropy minimization over the output distribution has proven effective as a TTA loss, we study using the intermediate distributions computed by transformers in the attention mechanism. We propose LookSharp, which minimizes the entropy of CLS-to-patch attention in the final layer as a novel TTA objective, encouraging the model to maintain focused attention on shifted data. We demonstrate that attention entropy minimization improves robustness on ImageNet-C. We also show that it is complementary to output entropy minimization and maintains performance on clean data.

Keywords

Cite

@article{arxiv.2511.18925,
  title  = {LookSharp: Attention Entropy Minimization for Test-Time Adaptation},
  author = {Yash Mali and Evan Shelhamer},
  journal= {arXiv preprint arXiv:2511.18925},
  year   = {2026}
}

Comments

imagenet, author update

R2 v1 2026-07-01T07:51:48.616Z