Locally Sampleable Uniform Symmetric Distributions
Abstract
We characterize the power of constant-depth Boolean circuits in generating uniform symmetric distributions. Let be a Boolean function where each output bit of depends only on input bits. Assume the output distribution of on uniform input bits is close to a uniform distribution with a symmetric support. We show that is essentially one of the following six possibilities: (1) point distribution on , (2) point distribution on , (3) uniform over , (4) uniform over strings with even Hamming weights, (5) uniform over strings with odd Hamming weights, and (6) uniform over all strings. This confirms a conjecture of Filmus, Leigh, Riazanov, and Sokolov (RANDOM 2023).
Cite
@article{arxiv.2411.08183,
title = {Locally Sampleable Uniform Symmetric Distributions},
author = {Daniel M. Kane and Anthony Ostuni and Kewen Wu},
journal= {arXiv preprint arXiv:2411.08183},
year = {2025}
}
Comments
This version improves the main result by removing dependence on d from the final distance bound