English

Locally Sampleable Uniform Symmetric Distributions

Computational Complexity 2025-02-27 v2

Abstract

We characterize the power of constant-depth Boolean circuits in generating uniform symmetric distributions. Let f ⁣:{0,1}m{0,1}nf\colon\{0,1\}^m\to\{0,1\}^n be a Boolean function where each output bit of ff depends only on O(1)O(1) input bits. Assume the output distribution of ff on uniform input bits is close to a uniform distribution DD with a symmetric support. We show that DD is essentially one of the following six possibilities: (1) point distribution on 0n0^n, (2) point distribution on 1n1^n, (3) uniform over {0n,1n}\{0^n,1^n\}, (4) uniform over strings with even Hamming weights, (5) uniform over strings with odd Hamming weights, and (6) uniform over all strings. This confirms a conjecture of Filmus, Leigh, Riazanov, and Sokolov (RANDOM 2023).

Keywords

Cite

@article{arxiv.2411.08183,
  title  = {Locally Sampleable Uniform Symmetric Distributions},
  author = {Daniel M. Kane and Anthony Ostuni and Kewen Wu},
  journal= {arXiv preprint arXiv:2411.08183},
  year   = {2025}
}

Comments

This version improves the main result by removing dependence on d from the final distance bound

R2 v1 2026-06-28T19:57:42.951Z