English

Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films

Other Condensed Matter 2007-05-23 v1

Abstract

Data analysis of the CCD files from x ray magnetic resonance scattering linearly polarized in transmission geometry produces information about the radial and azimuthal intensities. In a series of measurements of increasing photon energies trends in data are analyzed.

Keywords

Cite

@article{arxiv.cond-mat/0404371,
  title  = {Line Shape Analysis of Linear X Ray Magnetic Scattering CoPt Thin Films},
  author = {E. V. R. Chan},
  journal= {arXiv preprint arXiv:cond-mat/0404371},
  year   = {2007}
}