Lifetime statistics in chaotic dielectric microresonators
Optics
2009-05-13 v1
Abstract
We discuss the statistical properties of lifetimes of electromagnetic eigenmodes in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of anomalously short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance trapping phenomenon.
Keywords
Cite
@article{arxiv.0812.2823,
title = {Lifetime statistics in chaotic dielectric microresonators},
author = {Henning Schomerus and Jan Wiersig and Jörg Main},
journal= {arXiv preprint arXiv:0812.2823},
year = {2009}
}
Comments
7 pages, 5 figures