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Learning to mask: Towards generalized face forgery detection

Computer Vision and Pattern Recognition 2024-11-19 v2

Abstract

Generalizability to unseen forgery types is crucial for face forgery detectors. Recent works have made significant progress in terms of generalization by synthetic forgery data augmentation. In this work, we explore another path for improving the generalization. Our goal is to reduce the features that are easy to learn in the training phase, so as to reduce the risk of overfitting on specific forgery types. Specifically, in our method, a teacher network takes as input the face images and generates an attention map of the deep features by a diverse multihead attention ViT. The attention map is used to guide a student network to focus on the low-attended features by reducing the highly-attended deep features. A deep feature mixup strategy is also proposed to synthesize forgeries in the feature domain. Experiments demonstrate that, without data augmentation, our method is able to achieve promising performances on unseen forgeries and highly compressed data.

Keywords

Cite

@article{arxiv.2212.14309,
  title  = {Learning to mask: Towards generalized face forgery detection},
  author = {Jianwei Fei and Yunshu Dai and Huaming Wang and Zhihua Xia},
  journal= {arXiv preprint arXiv:2212.14309},
  year   = {2024}
}

Comments

Incorrect experimental setting

R2 v1 2026-06-28T07:56:00.363Z