Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface

T. Jaouen; S. Tricot; G. Delhaye; B. Lépine; D. Sébilleau; G. Jézéquel; P. Schieffer

doi:10.1103/PhysRevLett.111.027601

Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface

Materials Science 2015-06-16 v1

Authors: T. Jaouen , S. Tricot , G. Delhaye , B. Lépine , D. Sébilleau , G. Jézéquel , P. Schieffer

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Abstract

By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL23L23 Auger transition in MgO ultrathin films (4-6 \AA) on Ag(001). This resolution is exploited to demonstrate the possibility to control Mg atoms incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects, both band-offset variations at the interface and band bending effects in the oxide film.

Keywords

MgO/Ag(001) interface Auger electron diffraction layer-resolved study Mg incorporation work function band bending

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@article{arxiv.1306.6158,
  title  = {Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface},
  author = {T. Jaouen and S. Tricot and G. Delhaye and B. Lépine and D. Sébilleau and G. Jézéquel and P. Schieffer},
  journal= {arXiv preprint arXiv:1306.6158},
  year   = {2015}
}

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Accepted in Physical Review Letters

Layer-resolved study of Mg atom incorporation at MgO/Ag(001) buried interface

Abstract

Keywords

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