English

Landau level spectroscopy of Bi$_2$Te$_3$

Mesoscale and Nanoscale Physics 2020-08-11 v2 Materials Science

Abstract

Here we report on Landau level spectroscopy in magnetic fields up to 34 T performed on a thin film of topological insulator Bi2_2Te3_3 epitaxially grown on a BaF2_2 substrate. The observed response is consistent with the picture of a direct-gap semiconductor in which charge carriers closely resemble massive Dirac particles. The fundamental band gap reaches Eg=(175±5)E_g=(175\pm 5)~meV at low temperatures and it is not located on the trigonal axis, thus displaying either six or twelvefold valley degeneracy. Notably, our magneto-optical data do not indicate any band inversion. This suggests that the fundamental band gap is relatively distant from the Γ\Gamma point where profound inversion exists andgives rise to relativistic-like surface states of Bi2_2Te3_3.

Keywords

Cite

@article{arxiv.2004.13565,
  title  = {Landau level spectroscopy of Bi$_2$Te$_3$},
  author = {I. Mohelsky and A. Dubroka and J. Wyzula and A. Slobodeniuk and G. Martinez and Y. Krupko and B. A. Piot and O. Caha and J. Humlicek and G. Bauer and G. Springholz and M. Orlita},
  journal= {arXiv preprint arXiv:2004.13565},
  year   = {2020}
}

Comments

12 pages, 11 figures, to be published in Phys. Rev. B