English

Joule-assisted silicidation for short-channel silicon nanowire devices

Mesoscale and Nanoscale Physics 2011-10-27 v1

Abstract

We report on a technique enabling electrical control of the contact silicidation process in silicon nanowire devices. Undoped silicon nanowires were contacted by pairs of nickel electrodes and each contact was selectively silicided by means of the Joule effect. By a realtime monitoring of the nanowire electrical resistance during the contact silicidation process we were able to fabricate nickel-silicide/silicon/nickel- silicide devices with controlled silicon channel length down to 8 nm.

Keywords

Cite

@article{arxiv.1110.5668,
  title  = {Joule-assisted silicidation for short-channel silicon nanowire devices},
  author = {Massimo Mongillo and Panayotis Spathis and Georgios Katsaros and Pascal Gentile and Marc Sanquer and Silvano De Franceschi},
  journal= {arXiv preprint arXiv:1110.5668},
  year   = {2011}
}

Comments

6 pages, 4 figures