The measurement of the Casimir force between a large gold coated sphere and single crystal silicon plate is performed with an atomic force microscope. A rigorous statistical comparison of data with theory is done, without use of the concept of root-mean-square deviation, and excellent agreement is obtained. The Casimir force between metal and semiconductor is demonstrated to be significantly different than between two similar or dissimilar metals.
@article{arxiv.quant-ph/0505003,
title = {Investigation of the Casimir force between metal and semiconductor test bodies},
author = {F. Chen and U. Mohideen and G. L. Klimchitskaya and V. M. Mostepanenko},
journal= {arXiv preprint arXiv:quant-ph/0505003},
year = {2009}
}
Comments
9 pages, 3 figures; minor abbreviations in the text were made; accepted for publication in Phys. Rev. A (Rapid Communications)