English

Intrinsic Instability of Aberration-Corrected Electron Microscopes

Instrumentation and Detectors 2015-06-11 v1 Materials Science Other Condensed Matter

Abstract

Aberration-corrected microscopes with sub-atomic resolution will impact broad areas of science and technology. However, the experimentally observed lifetime of the corrected state is just a few minutes. Here we show that the corrected state is intrinsically unstable; the higher its quality, the more unstable it is. Analyzing the Contrast Transfer Function near optimum correction, we define an 'instability budget' which allows a rational trade-off between resolution and stability. Unless control systems are developed to overcome these challenges, intrinsic instability poses a fundamental limit to the resolution practically achievable in the electron microscope.

Keywords

Cite

@article{arxiv.1209.5340,
  title  = {Intrinsic Instability of Aberration-Corrected Electron Microscopes},
  author = {S. M. Schramm and S. J. van der Molen and R. M. Tromp},
  journal= {arXiv preprint arXiv:1209.5340},
  year   = {2015}
}

Comments

accepted, Physical Review Letters

R2 v1 2026-06-21T22:10:11.647Z