Interlayer exchange couplings were examined for Co2FeAl0.5Si0.5(CFAS)/Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90 degree coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.
Cite
@article{arxiv.0811.3278,
title = {Interlayer exchange coupling in Co2FeAl0.5Si0.5/Cr/Co2FeAl0.5Si0.5 trilayers},
author = {T. Furubayashi and K. Kodama and H. S. Goripati and Y. K. Takahashi and K. Inomata and K. Hono},
journal= {arXiv preprint arXiv:0811.3278},
year = {2009}
}
Comments
12 pages, 4 figures, presented at the 53rd Annual Conference on Magnetism and Magnetic Materials, to be published in J. Appl. Phys