Interfacial Energy and Fine Defect Structures for Incoherent Films
Condensed Matter
2007-05-23 v2
Abstract
This note summarizes recent results in which modern techniques of the calculus of variations are used to obtain qualitative features of film-substrate interfaces for a broad class of interfacial energies. In particular, we show that the existence of a critical thickness for incoherency and the formation of interfacial dislocations depend strongly on the convexity and smoothness of the interfacial energy function.
Cite
@article{arxiv.cond-mat/9910360,
title = {Interfacial Energy and Fine Defect Structures for Incoherent Films},
author = {Paolo Cermelli and Morton E. Gurtin and Giovanni Leoni},
journal= {arXiv preprint arXiv:cond-mat/9910360},
year = {2007}
}
Comments
4 pages