English

Improving Negative Sampling for Word Representation using Self-embedded Features

Machine Learning 2018-06-27 v3 Computation and Language Machine Learning

Abstract

Although the word-popularity based negative sampler has shown superb performance in the skip-gram model, the theoretical motivation behind oversampling popular (non-observed) words as negative samples is still not well understood. In this paper, we start from an investigation of the gradient vanishing issue in the skipgram model without a proper negative sampler. By performing an insightful analysis from the stochastic gradient descent (SGD) learning perspective, we demonstrate that, both theoretically and intuitively, negative samples with larger inner product scores are more informative than those with lower scores for the SGD learner in terms of both convergence rate and accuracy. Understanding this, we propose an alternative sampling algorithm that dynamically selects informative negative samples during each SGD update. More importantly, the proposed sampler accounts for multi-dimensional self-embedded features during the sampling process, which essentially makes it more effective than the original popularity-based (one-dimensional) sampler. Empirical experiments further verify our observations, and show that our fine-grained samplers gain significant improvement over the existing ones without increasing computational complexity.

Keywords

Cite

@article{arxiv.1710.09805,
  title  = {Improving Negative Sampling for Word Representation using Self-embedded Features},
  author = {Long Chen and Fajie Yuan and Joemon M. Jose and Weinan Zhang},
  journal= {arXiv preprint arXiv:1710.09805},
  year   = {2018}
}

Comments

Accepted in WSDM 2018

R2 v1 2026-06-22T22:26:51.108Z