English

Improving Electron Micrograph Signal-to-Noise with an Atrous Convolutional Encoder-Decoder

Computer Vision and Pattern Recognition 2020-05-21 v2

Abstract

We present an atrous convolutional encoder-decoder trained to denoise 512×\times512 crops from electron micrographs. It consists of a modified Xception backbone, atrous convoltional spatial pyramid pooling module and a multi-stage decoder. Our neural network was trained end-to-end to remove Poisson noise applied to low-dose (\ll 300 counts ppx) micrographs created from a new dataset of 17267 2048×\times2048 high-dose (>> 2500 counts ppx) micrographs and then fine-tuned for ordinary doses (200-2500 counts ppx). Its performance is benchmarked against bilateral, non-local means, total variation, wavelet, Wiener and other restoration methods with their default parameters. Our network outperforms their best mean squared error and structural similarity index performances by 24.6% and 9.6% for low doses and by 43.7% and 5.5% for ordinary doses. In both cases, our network's mean squared error has the lowest variance. Source code and links to our new high-quality dataset and trained network have been made publicly available at https://github.com/Jeffrey-Ede/Electron-Micrograph-Denoiser

Cite

@article{arxiv.1807.11234,
  title  = {Improving Electron Micrograph Signal-to-Noise with an Atrous Convolutional Encoder-Decoder},
  author = {Jeffrey M. Ede},
  journal= {arXiv preprint arXiv:1807.11234},
  year   = {2020}
}

Comments

15 pages, 10 figures, 1 table

R2 v1 2026-06-23T03:18:41.605Z