Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets
Abstract
A new diagnosis method for high energy ions utilizing a single CR-39 detector mounted on plastic plates is demonstrated to identify the presence of the high energy component beyond the CR-39's detection threshold limit. On irradiation of the CR-39 detector unit with a 25 MeV per nucleon He ion beam from conventional rf-accelerators, a large number of etch pits having elliptical opening shapes are observed on the rear surface of the CR-39. Detailed investigations reveal that these etch pits are created by heavy ions inelastically backscattered from the plastic plates. This ion detection method is applied to laser-driven ion acceleration experiments using cluster-gas targets, and ion signals with energies up to 50 MeV per nucleon are identified.
Keywords
Cite
@article{arxiv.1112.4948,
title = {Identification of high energy ions using backscattered particles in laser-driven ion acceleration with cluster-gas targets},
author = {Y. Fukuda and H. Sakaki and M. Kanasaki and A. Yogo and S. Jinno and M. Tampo and A. Ya. Faenov and T. A. Pikuz and Y. Hayashi and M. Kando and A. S. Pirozhkov and T. Shimomura and H. Kiriyama and S. Kurashima and T. Kamiya and K. Oda and T. Yamauchi and K. Kondo and S. V. Bulanov},
journal= {arXiv preprint arXiv:1112.4948},
year = {2011}
}