We have developed a technique that extends static scanning electron microscopic imaging to include hyperspectral mapping of fast thermal and externally-driven movements at up to Megahertz frequencies. It is based on spectral analysis of the secondary electron flux generated by a focused electron beam incident on the moving object. We demonstrate detection of nanowire Brownian motion and hyperspectral mapping of stimulated oscillations of flea setae with deep sub-nanometer displacement sensitivity.
@article{arxiv.2005.05160,
title = {Hyperspectral Nanomotion Microscopy},
author = {Tongjun Liu and Jun-Yu Ou and Kevin F. MacDonald and Nikolay I. Zheludev},
journal= {arXiv preprint arXiv:2005.05160},
year = {2021}
}