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High-Throughput, High-Performance Deep Learning-Driven Light Guide Plate Surface Visual Quality Inspection Tailored for Real-World Manufacturing Environments

Computer Vision and Pattern Recognition 2022-12-22 v1 Artificial Intelligence

Abstract

Light guide plates are essential optical components widely used in a diverse range of applications ranging from medical lighting fixtures to back-lit TV displays. In this work, we introduce a fully-integrated, high-throughput, high-performance deep learning-driven workflow for light guide plate surface visual quality inspection (VQI) tailored for real-world manufacturing environments. To enable automated VQI on the edge computing within the fully-integrated VQI system, a highly compact deep anti-aliased attention condenser neural network (which we name LightDefectNet) tailored specifically for light guide plate surface defect detection in resource-constrained scenarios was created via machine-driven design exploration with computational and "best-practices" constraints as well as L_1 paired classification discrepancy loss. Experiments show that LightDetectNet achieves a detection accuracy of ~98.2% on the LGPSDD benchmark while having just 770K parameters (~33X and ~6.9X lower than ResNet-50 and EfficientNet-B0, respectively) and ~93M FLOPs (~88X and ~8.4X lower than ResNet-50 and EfficientNet-B0, respectively) and ~8.8X faster inference speed than EfficientNet-B0 on an embedded ARM processor. As such, the proposed deep learning-driven workflow, integrated with the aforementioned LightDefectNet neural network, is highly suited for high-throughput, high-performance light plate surface VQI within real-world manufacturing environments.

Keywords

Cite

@article{arxiv.2212.10632,
  title  = {High-Throughput, High-Performance Deep Learning-Driven Light Guide Plate Surface Visual Quality Inspection Tailored for Real-World Manufacturing Environments},
  author = {Carol Xu and Mahmoud Famouri and Gautam Bathla and Mohammad Javad Shafiee and Alexander Wong},
  journal= {arXiv preprint arXiv:2212.10632},
  year   = {2022}
}

Comments

arXiv admin note: substantial text overlap with arXiv:2204.11765

R2 v1 2026-06-28T07:45:41.131Z