High quality ultrafast transmission electron microscopy using resonant microwave cavities
Abstract
Ultrashort, low-emittance electron pulses can be created at a high repetition rate by using a TM deflection cavity to sweep a continuous beam across an aperture. These pulses can be used for time-resolved electron microscopy with atomic spatial and temporal resolution at relatively large average currents. In order to demonstrate this, a cavity has been inserted in a transmission electron microscope, and picosecond pulses have been created. No significant increase of either emittance or energy spread has been measured for these pulses. At a peak current of pA, the root-mean-square transverse normalized emittance of the electron pulses is m rad in the direction parallel to the streak of the cavity, and m rad in the perpendicular direction for pulses with a pulse length of 1.1-1.3 ps. Under the same conditions, the emittance of the continuous beam is m rad. Furthermore, for both the pulsed and the continuous beam a full width at half maximum energy spread of eV has been measured.
Cite
@article{arxiv.1709.02205,
title = {High quality ultrafast transmission electron microscopy using resonant microwave cavities},
author = {W. Verhoeven and J. F. M. van Rens and E. R. Kieft and P. H. A. Mutsaers and O. J. Luiten},
journal= {arXiv preprint arXiv:1709.02205},
year = {2018}
}