High Pressure X-Ray Diffraction Study of UMn2Ge2

Vasudeva Siruguri; S. K. Paranjpe; P. Raj; A. Sathyamoorthy; Jean Paul Itie; Alain Polian

doi:10.1016/j.physb.2003.09.267

High Pressure X-Ray Diffraction Study of UMn2Ge2

Materials Science 2009-11-10 v1

Authors: Vasudeva Siruguri , S. K. Paranjpe , P. Raj , A. Sathyamoorthy , Jean Paul Itie , Alain Polian

View on arXiv ↗ PDF ↗ DOI ↗

Abstract

Uranium manganese germanide, UMn2Ge2, crystallizes in body-centered tetragonal ThCr2Si2 structure with space group I4/mmm, a = 3.993A and c = 10.809A under ambient conditions. Energy dispersive X-ray diffraction was used to study the compression behaviour of UMn2Ge2 in a diamond anvil cell. The sample was studied up to static pressure of 26 GPa and a reversible structural phase transition was observed at a pressure of ~ 16.1 GPa. Unit cell parameters were determined up to 12.4 GPa and the calculated cell volumes were found to be well reproduced by a Murnaghan equation of state with K0 = 73.5 GPa and K' = 11.4. The structure of the high pressure phase above 16.0 GPa is quite complicated with very broad lines and could not be unambiguously determined with the available instrument resolution.

Keywords

high-pressure phase transitions phase transitions crystal growth and phase transitions

Cite

@article{arxiv.cond-mat/0407775,
  title  = {High Pressure X-Ray Diffraction Study of UMn2Ge2},
  author = {Vasudeva Siruguri and S. K. Paranjpe and P. Raj and A. Sathyamoorthy and Jean Paul Itie and Alain Polian},
  journal= {arXiv preprint arXiv:cond-mat/0407775},
  year   = {2009}
}

High Pressure X-Ray Diffraction Study of UMn2Ge2

Abstract

Keywords

Cite

Related papers