Excitons -- quasiparticles formed by the binding of an electron and a hole through electrostatic attraction -- hold promise in the fields of quantum light confinement and optoelectronic sensing. Atomically thin transition metal dichalcogenides (TMDs) provide a versatile platform for hosting and manipulating excitons, given their robust Coulomb interactions and exceptional sensitivity to dielectric environments. In this study, we introduce a cryogenic scanning probe photoelectrical sensing platform, termed exciton-resonant microwave impedance microscopy (ER-MIM). ER-MIM enables ultra-sensitive probing of exciton polarons and their Rydberg states at the nanoscale. Utilizing this technique, we explore the interplay between excitons and material properties, including carrier density, in-plane electric field, and dielectric screening. Furthermore, we employ deep learning for automated data analysis and quantitative extraction of electrical information, unveiling the potential of exciton-assisted nano-electrometry. Our findings establish an invaluable sensing platform and readout mechanism, advancing our understanding of exciton excitations and their applications in the quantum realm.
@article{arxiv.2311.04211,
title = {Harnessing excitons at the nanoscale -- photoelectrical platform for quantitative sensing and imaging},
author = {Zhurun Ji and Mark E. Barber and Ziyan Zhu and Carlos R. Kometter and Jiachen Yu and Kenji Watanabe and Takashi Taniguchi and Mengkun Liu and Thomas P. Devereaux and Benjamin E. Feldman and Zhixun Shen},
journal= {arXiv preprint arXiv:2311.04211},
year = {2023}
}