English

Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV

Optics 2013-05-28 v1 Instrumentation and Detectors

Abstract

Spectrographs take snapshots of photon spectra with array detectors by dispersing photons of different energies into distinct directions and spacial locations. Spectrographs require optics with a large angular dispersion rate as the key component. In visible light optics diffraction gratings are used for this purpose. In the hard x-ray regime, achieving large dispersion rates is a challenge. Here we show that multi-crystal, multi-Bragg-reflection arrangements feature cumulative angular dispersion rates almost two orders of magnitude larger than those attainable with a single Bragg reflection. As a result, the multi-crystal arrangements become potential dispersing elements of hard x-ray spectrographs. The hard x-ray spectrograph principles are demonstrated by imaging a spectrum of photons with a record high resolution of ΔE90μ\Delta E \simeq 90 \mueV in hard x-ray regime, using multi-crystal optics as dispersing element. The spectrographs can boost research using inelastic ultra-high-resolution x-ray spectroscopies with synchrotrons and seeded XFELs.

Keywords

Cite

@article{arxiv.1210.6283,
  title  = {Hard X-ray Spectrographs with Resolution Beyond 100 micro-eV},
  author = {Yuri Shvyd'ko and Stanislav Stoupin and Kiran Mundboth and Jungho Kim},
  journal= {arXiv preprint arXiv:1210.6283},
  year   = {2013}
}
R2 v1 2026-06-21T22:26:34.375Z