English

Group Testing using left-and-right-regular sparse-graph codes

Information Theory 2017-01-27 v1 math.IT

Abstract

We consider the problem of non-adaptive group testing of NN items out of which KK or less items are known to be defective. We propose a testing scheme based on left-and-right-regular sparse-graph codes and a simple iterative decoder. We show that for any arbitrarily small ϵ>0\epsilon>0 our scheme requires only m=cϵKlogc1NKm=c_\epsilon K\log \frac{c_1N}{K} tests to recover (1ϵ)(1-\epsilon) fraction of the defective items with high probability (w.h.p) i.e., with probability approaching 11 asymptotically in NN and KK, where the value of constants cϵc_\epsilon and \ell are a function of the desired error floor ϵ\epsilon and constant c1=cϵc_1=\frac{\ell}{c_\epsilon} (observed to be approximately equal to 1 for various values of ϵ\epsilon). More importantly the iterative decoding algorithm has a sub-linear computational complexity of O(KlogNK)\mathcal{O}(K\log \frac{N}{K}) which is known to be optimal. Also for m=c2KlogKlogNKm=c_2 K\log K\log \frac{N}{K} tests our scheme recovers the \textit{whole} set of defective items w.h.p. These results are valid for both noiseless and noisy versions of the problem as long as the number of defective items scale sub-linearly with the total number of items, i.e., K=o(N)K=o(N). The simulation results validate the theoretical results by showing a substantial improvement in the number of tests required when compared to the testing scheme based on left-regular sparse-graphs.

Keywords

Cite

@article{arxiv.1701.07477,
  title  = {Group Testing using left-and-right-regular sparse-graph codes},
  author = {Avinash Vem and Nagaraj T. Janakiraman and Krishna R. Narayanan},
  journal= {arXiv preprint arXiv:1701.07477},
  year   = {2017}
}

Comments

Part of this work is submitted to IEEE International Symposium on Information Theory 2017