The simultaneous combination of scanning probe methods (tunnelling and force microscopies, STM and AFM) is a unique way to get an information about crystallographic and electronic structure of the studied surface. Here we apply these methods accompanied by the state-of-the-art density functional theory (DFT) calculations to shed a light on the structure and electronic properties of the strongly-corrugated graphene/Rh(111) system. The atomically resolved images are obtained for both STM and AFM modes and compared with the DFT results showing good agreement between theory and experiment.
@article{arxiv.1502.00975,
title = {Graphene layer on Rh(111): combined DFT, STM, and NC-AFM studies},
author = {Petar Stojanov and Elena Voloshina and Yuriy Dedkov and Stefan Schmitt and Torben Haenke and Andreas Thissen},
journal= {arXiv preprint arXiv:1502.00975},
year = {2015}
}