Gain limits of a Thick GEM in high-purity Ne, Ar and Xe

J. Miyamoto; A. Breskin; V. Peskov

doi:10.1088/1748-0221/5/05/P05008

Gain limits of a Thick GEM in high-purity Ne, Ar and Xe

Instrumentation and Detectors 2014-11-20 v1

Authors: J. Miyamoto , A. Breskin , V. Peskov

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Abstract

The dependence of the avalanche charge gain in Thick Gas Electron Multipliers (THGEM) on the purity of Ne, Ar and Xe filling gases was investigated. The gain, measured with alpha-particles in standard conditions (atmospheric pressure, room temperature), was found to considerably drop in gases purified by non-evaporable getters. On the other hand, small N2 admixtures to noble gases resulted in high reachable gains. The results are of general relevance in the operation of gas-avalanche detectors in noble gases, particularly that of two-phase cryogenic detectors for rare events.

Keywords

THGEM gas purity avalanche gain noble gases N2 admixture cryogenic detectors

Cite

@article{arxiv.1001.4741,
  title  = {Gain limits of a Thick GEM in high-purity Ne, Ar and Xe},
  author = {J. Miyamoto and A. Breskin and V. Peskov},
  journal= {arXiv preprint arXiv:1001.4741},
  year   = {2014}
}

Comments

15 pages, 6 figures, submitted to JINST

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