Quantum enhanced microscopy allows for measurements at high sensitivities and low damage. Recently, multi-pass microscopy was introduced as such a scheme, exploiting the sensitivity enhancement offered by multiple photon-sample interactions. Here we theoretically and numerically compare three different contrast enhancing techniques that are all based on self-imaging cavities: CW cavity enhanced microscopy, cavity ring-down microscopy and multi-pass microscopy. We show that all three schemes can lead to sensitivities beyond the standard quantum limit.
@article{arxiv.1704.05217,
title = {Full-field cavity enhanced microscopy techniques},
author = {Stefan Nimmrichter and Chi-Fang Chen and Brannon B. Klopfer and Mark A. Kasevich and Thomas Juffmann},
journal= {arXiv preprint arXiv:1704.05217},
year = {2017}
}