Verification presents a major bottleneck in Integrated Circuit (IC) development, consuming nearly 70% of the total development effort. While the Universal Verification Methodology (UVM) is widely used in industry to improve verification efficiency through structured and reusable testbenches, constructing these testbenches and generating sufficient stimuli remain challenging. These challenges arise from the considerable manual coding effort required, repetitive manual execution of multiple EDA tools, and the need for in-depth domain expertise to navigate complex designs.Here, we present UVM^2, an automated verification framework that leverages Large Language Models (LLMs) to generate UVM testbenches and iteratively refine them using coverage feedback, significantly reducing manual effort while maintaining rigorous verification standards.To evaluate UVM^2, we introduce a benchmark suite comprising Register Transfer Level (RTL) designs of up to 1.6K lines of code.The results show that UVM^2 reduces testbench setup time by up to UVM^2 compared to experienced engineers, and achieve average code and function coverage of 87.44% and 89.58%, outperforming state-of-the-art solutions by 20.96% and 23.51%, respectively.
@article{arxiv.2504.19959,
title = {From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification},
author = {Junhao Ye and Yuchen Hu and Ke Xu and Dingrong Pan and Qichun Chen and Jie Zhou and Shuai Zhao and Xinwei Fang and Xi Wang and Nan Guan and Zhe Jiang},
journal= {arXiv preprint arXiv:2504.19959},
year = {2026}
}
Comments
Accepted by the IEEE/ACM International Conference on Computer-Aided Design (ICCAD) 2025. This version includes the camera-ready manuscript