Barrium fluoride (BaF2) thin films were prepared by electron beam evaporation technique at room temperature, on glass, Silicon and Aluminum substrates having thickness of 20 nm each. Its structural property and surface morphology were studied using glancing angle X-ray diffraction (GAXRD) and atomic force microscopy (AFM) respectively. It was found that grain size, average surface roughness and interface width changes with different substrates. Higuchi algorithm is applied for the fractal measure on AFM images.It was observed found that the fractal dimension varied from substrate to substrate.
@article{arxiv.1705.06889,
title = {Fractal analysis of BaF2 thin films deposited on different substrates},
author = {Kavyashree and R. K. Pandey and R. P. Yadav and Manvendra Kumar and A. K. Mittal and A. C. Pandey and S. N. Pandey},
journal= {arXiv preprint arXiv:1705.06889},
year = {2017}
}