Fitting ellipses to noisy measurements
Systems and Control
2021-11-11 v1 Systems and Control
Abstract
This work deals with fitting of ellipses to noisy measurements. The literature knows many different approaches for this. The main representatives are presented and discussed in this paper. Furthermore, the case is considered when outliers are present in the measurement data. Robust methods which are less sensitive to outliers are suitable for this case. All discussed methods are compared by a simulation. The code for the simulation is available for free use on github.com/sebdi/ellipse-fitting.
Keywords
Cite
@article{arxiv.2111.05359,
title = {Fitting ellipses to noisy measurements},
author = {Sebastian Dingler},
journal= {arXiv preprint arXiv:2111.05359},
year = {2021}
}