First results for second generation SiSeRO CCD devices
Abstract
The Astro2020 Decadal recommended the development of a suite of next generation astronomical observatories spanning the X-ray to near-IR spectrum. These programs require fast, extremely low noise detectors to fulfill their science goals. To address this technology gap, Stanford X-ray Astronomy and Observational Cosmology (XOC) group, MIT Lincoln Laboratory (MIT-LL), and MIT Kavli Institute (MKI) are advancing Single electron Sensitive Read Out (SiSeRO), a multiband detector technology capable of achieving substantially sub-electron noise via Repetitive Non-Destructive Readout (RNDR). We present initial results for our second generation SiSeRO CCDs. We also discuss our test bed, including a readout electronics system capable of accommodating all second-generation SiSeRO CCD variants utilizing the XOC-designed Multi-Channel Readout Chip (MCRC) ASIC.
Cite
@article{arxiv.2607.18430,
title = {First results for second generation SiSeRO CCD devices},
author = {Abigail Y. Pan and Declan O'Neill and Kevan Donlon and Peter Orel and Sven Herrmann and Steven Allen and Marshall W. Bautz and Tanmoy Chattopadhyay and Michael Cooper and Catherine E. Grant and Jill Juneau and Chris Leitz and Beverly LaMarr and Eric D. Miller and Glenn Morris and Tonya L. Peshel and Artem Poliszczuk and Gregory Prigozhin and Ilya Prigozhin and Haley R. Stueber and Keith Warner},
journal= {arXiv preprint arXiv:2607.18430},
year = {2026}
}
Comments
10 pages, 9 figures, to appear in SPIE Astronomical Telescopes + Instrumentation 2026 proceedings