English

Fast random sampling and small noise analysis for stochastic control models

Probability 2026-03-18 v1

Abstract

In this paper, we study a linear control system with a given state feedback law. The system is influenced by rapid random sampling occurring at frequency 1n,nN\frac 1n, n \in \mathbb N, as well as by white noise of small intensity ε(0,1]\varepsilon \in (0, 1]. We study the behavior of the system as nn \to \infty and ε0\varepsilon \searrow 0 jointly, and prove that it converges to its ideal deterministic analogue. For the random fluctuations around its analogous deterministic trajectory, we obtain either stochastic differential equations or an ordinary differential equation depending on the joint behavior of ε\varepsilon and nn. Further, we extend this problem to a nonlinear system driven by multiplicative white noise, where the noise intensity is scaled by a small parameter. In this case, we again perform a similar analysis as in the linear case.

Keywords

Cite

@article{arxiv.2603.16399,
  title  = {Fast random sampling and small noise analysis for stochastic control models},
  author = {Sarvesh Ravichandran Iyer and Vivek Kumar},
  journal= {arXiv preprint arXiv:2603.16399},
  year   = {2026}
}

Comments

57 pages, to be sent to the Annals of Applied Probability

R2 v1 2026-07-01T11:24:00.984Z