Far field imaging of a dielectric inclusion
Mathematical Physics
2016-10-27 v1 math.MP
Abstract
A non-iterative topological sensitivity framework for guaranteed far field detection of a dielectric inclusion is presented. The cases of single and multiple measurements of the electric far field scattering amplitude at a fixed frequency are taken into account. The performance of the algorithm is analyzed theoretically in terms of resolution, stability, and signal-to-noise ratio.
Keywords
Cite
@article{arxiv.1504.02869,
title = {Far field imaging of a dielectric inclusion},
author = {Abdul Wahab and Naveed Ahmed and Tasawar Abbas},
journal= {arXiv preprint arXiv:1504.02869},
year = {2016}
}
Comments
6 pages, 5th International Workshop on New Computational Methods for Inverse Problems, ENS Cachan, France