Extreme Ultraviolet-Excited Time-Resolved Luminescence Spectroscopy Using an Ultrafast Table-Top High-Harmonic Generation Source
Abstract
We present a table-top extreme ultraviolet (XUV) beamline for measuring time- and frequency-resolved XUV excited optical luminescence (XEOL) with additional femtosecond-resolution XUV transient absorption spectroscopy functionality. XUV pulses are generated via high-harmonic generation using a near-infrared pulse in a noble gas medium, and focused to excite luminescence from a solid sample. The luminescence is collimated and guided into a streak camera, where its spectral components are temporally resolved with picosecond temporal resolution. We time-resolve XUV excited luminescence and compare the results to luminescence decays excited at longer wavelengths for three different materials : (i) sodium salicylate, an often used XUV scintillator, (ii) fluorescent labeling molecule 4-carbazole benzoic acid (CB), and (iii) a zirconium metal oxo-cluster labeled with CB, which is a photoresist candidate for extreme-ultraviolet lithography. Our results establish time-resolved XEOL as a new technique to measure transient XUV-driven phenomena in solid-state samples, and identify decay mechanisms of molecules following XUV and soft-X-ray excitation.
Keywords
Cite
@article{arxiv.2111.01052,
title = {Extreme Ultraviolet-Excited Time-Resolved Luminescence Spectroscopy Using an Ultrafast Table-Top High-Harmonic Generation Source},
author = {M. van der Geest and N. Sadegh and T. M. Meerwijk and E. I. Wooning and L. Wu and R. Bloem and S. Castellanos Ortega and A. M. Brouwer and P. M. Kraus},
journal= {arXiv preprint arXiv:2111.01052},
year = {2021}
}