English

Extrapolated Elliptic Regularity and Application to the van Roosbroeck system of Semiconductors

Analysis of PDEs 2020-03-26 v1

Abstract

In this paper we present a general extrapolated elliptic regularity result for second order differential operators in divergence form on fractional Sobolev-type spaces of negative order XDs1,q(Ω)X^{s-1,q}_D(\Omega) for s>0s > 0 small, including mixed boundary conditions and with a fully nonsmooth geometry of Ω\Omega and the Dirichlet boundary part DD. We expect the result to find applications in the analysis of nonlinear parabolic equations, in particular for quasilinear problems or when treating coupled systems of equations. To demonstrate the usefulness of our result, we give a new proof of local-in-time existence and uniqueness for the van Roosbroeck system for semiconductor devices which is much simpler than already established proofs.

Keywords

Cite

@article{arxiv.2003.11379,
  title  = {Extrapolated Elliptic Regularity and Application to the van Roosbroeck system of Semiconductors},
  author = {Hannes Meinlschmidt and Joachim Rehberg},
  journal= {arXiv preprint arXiv:2003.11379},
  year   = {2020}
}