Exploring causal physical mechanisms via non-gaussian linear models and deep kernel learning: applications for ferroelectric domain structures

Rapid emergence of the multimodal imaging in scanning probe, electron, and optical microscopies have brought forth the challenge of understanding the information contained in these complex data sets, targeting both the intrinsic correlations between different channels and further exploring the underpinning causal physical mechanisms. Here, we develop such analysis framework for the Piezoresponse Force Microscopy. We argue that under certain conditions, we can bootstrap experimental observations with the prior knowledge of materials structure to get information on certain non-observed properties, and demonstrate linear causal analysis for PFM observables. We further demonstrate that this approach can be extended to complex descriptors using the deep kernel learning (DKL) model. In this DKL analysis, we use the prior information on domain structure within the image to predict the physical properties. This analysis demonstrates the correlative relationships between morphology, piezoresponse, elastic property, etc. at nanoscale. The prediction of morphology and other physical parameters illustrates a mutual interaction between surface condition and physical properties in ferroelectric materials. This analysis is universal and can be extended to explore the correlative relationships of other multi-channel datasets.